Angular Dependence and Enhanced Exchange Bias in Ion-beam Bombarded NiCo/(Ni,Co)O Bilayers

  • Lin, K.W. (Department of Materials Science and Engineering, National Chung Hsing University) ;
  • Guo, J.Y. (Department of Materials Science and Engineering, National Chung Hsing University) ;
  • Liu, H.Y. (Department of Materials Science and Engineering, National Chung Hsing University) ;
  • Tzeng, S.D. (Department of Physics, National Dong Hua University) ;
  • Lierop, J. Van (Department of Physics and Astronomy, University of Manitoba) ;
  • Suzuki, T. (Information Storage Materials Laboratory, Toyota Technological Institute)
  • Published : 2008.12.10