Proceedings of the Korean Vacuum Society Conference (한국진공학회:학술대회논문집)
- 2008.02a
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- Pages.309-309
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- 2008
The effect of electrical stress on the leakage current of polycrystalline silicon transistors
- Jeong, Jin-Wook (Display and Nanosystem Laboratory, College of Engineering, Korea University) ;
- Kwon, Jae-Hong (Display and Nanosystem Laboratory, College of Engineering, Korea University) ;
- Shin, Sang-Il (Display and Nanosystem Laboratory, College of Engineering, Korea University) ;
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Han, Il-Ki
(Nano Device Research Center, Korea Institute of Science and Technology)
;
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Ju, Byeong-Kwon
(Display and Nanosystem Laboratory, College of Engineering, Korea University)
- Published : 2008.02.14
Abstract
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