Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference (한국전기전자재료학회:학술대회논문집)
- 2008.06a
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- Pages.447-448
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- 2008
Holographic Grating Formation of Amorphous AsSeS Thin Film
비정질 AsSeS 박막의 홀로그래픽 데이터 격자형성
- Ju, Long-Yun (Dept. of Electronic Materials Eng. Kwangwoon Univ.) ;
- Lee, Song-Hee (Dept. of Electronic Materials Eng. Kwangwoon Univ.) ;
- Nam, Ki-Hyun (Dept. of Electronic Materials Eng. Kwangwoon Univ.) ;
- Koo, Sang-Mo (Dept. of Electronic Materials Eng. Kwangwoon Univ.) ;
- Chung, Hong-Bay (Dept. of Electronic Materials Eng. Kwangwoon Univ.)
- 구용운 (광운대학교 전자재료공학과) ;
- 이송희 (광운대학교 전자재료공학과) ;
- 남기현 (광운대학교 전자재료공학과) ;
- 구상모 (광운대학교 전자재료공학과) ;
- 정홍배 (광운대학교 전자재료공학과)
- Published : 2008.06.19
Abstract
In this paper, we investigated the diffraction grating efficiency on AsSeS and Ag-doped amorphous chalcogenide Ag/AsSeS thin film for used to volume hologram. The film thickness was 0.5um and diffraction efficiency was obtained from (P:P) polarized He-Ne (632.8nm)laser beam on AsSeS and Ag/AsSeS thin films. As a results, diffraction grating was not formed at AsSeS thin film but at Ag-doped AsSeS thin film, diffraction grating was formed well compare with the former.