Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference (한국전기전자재료학회:학술대회논문집)
- 2008.06a
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- Pages.297-297
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- 2008
Growth and characterization of oxide buffer layer on IBAD_MgO template for HTS coated conductors
박막형 고온초전도 선재를 위한 산화물 완충층의 IBAD_MgO 기판에서의 성장과 특성
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Ko, Rock-Kil
(Korea Electrotechnology Resarch Institute) ;
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Jang, Se-Hoon
(Changwon National Univ.) ;
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Ha, Hong-Soo
(Korea Electrotechnology Resarch Institute) ;
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Kim, Ho-Sup
(Korea Electrotechnology Resarch Institute) ;
- Song, Kyu-Jeong (Korea Electrotechnology Resarch Institute) ;
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Ha, Dong-Woo
(Korea Electrotechnology Resarch Institute) ;
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Oh, Sang-Soo
(Korea Electrotechnology Resarch Institute) ;
- Park, Chan (Seoul National Univ.) ;
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Moon, Seung-Hyun
(SuNAM) ;
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Kim, Young-Cheol
(Pusan National Univ.)
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고락길
(한국전기연구원) ;
-
장세훈
(창원대학교) ;
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하홍수
(한국전기연구원) ;
-
김호섭
(한국전기연구원) ;
- 송규정 (한국전기연구원) ;
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하동우
(한국전기연구원) ;
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오상수
(한국전기연구원) ;
- 박찬 (서울대학교) ;
-
문승현
((주)서남) ;
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김영철
(부산대학교)
- Published : 2008.06.19
Abstract
Buffer layers play an important role in the development of high critical current density coated conductor.