한국정보디스플레이학회:학술대회논문집
- 한국정보디스플레이학회 2008년도 International Meeting on Information Display
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- Pages.859-862
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- 2008
High Spatial Resolution Optical Characterization of LCDs and their Components
초록
We present a new tool to measure precisely the emissive properties of displays at the pixel level with submicrometric spatial resolution. It is useful to check the technological defects and their impact on the emissive properties of the displays. Backlight films and transflective and reflective displays are measured.