Proceedings of the KSME Conference (대한기계학회:학술대회논문집)
- 2008.11b
- /
- Pages.2670-2675
- /
- 2008
A Scanning Flow Impedance Micrscope
유체역학 현상을 이용한 현미경 검사법 개발
- Published : 2008.11.05
Abstract
We introduce a new type of surface microscope using hydrodynamic phenomena. The fluid flow through the opening of the pipette probe is blocked at short distances between the probe and the surface, thus increasing the pressure loss. Therefore, a scanning flow impedance microscope (SFIM) can image the surface topology by scanning the probe with measuring the pressure loss. The SFIM can display the topology regardless of surface hardness, surface electrical conductivity, and surrounding fluid. The present letter contains the first experimental results on surface topography obtained with this novel microscope. The preliminary results in air demonstrate the lateral resolution of the SFIM is very close to the inner diameter of the probe.