A study on mechanical characterization of nano-thick films fabricated by transfer assembly technique

이송조립기술로 제조된 나노 박막의 기계적인 특성 평가에 관한 연구

  • 최현주 (한국기계연구원 나노기계연구본부) ;
  • 김재현 (한국기계연구원 나노기계연구본부) ;
  • 이상주 (한국기계연구원 나노기계연구본부) ;
  • 이학주 (한국기계연구원 나노기계연구본부)
  • Published : 2008.11.05

Abstract

The transfer assembly (or transfer printing) technique is a promising method for fabricating multi-scale structures on various substrates including semiconductors and polymers, and has been applied to fabrication of flexible devices with superior performance to conventional organic flexible devices. The mechanical behaviors of the structures fabricated by the transfer assembly is a very important information for design and reliability evaluation purpose, but the measurement of the behaviors is difficult since their critical-dimensions are very tiny. In this study, Au films with nano-scale thickness were fabricated on a silicon substrate and their mechanical properties were measured using micro-tensile test. The Au films on the silicon substrate were then transferred to a PDMS substrate using the transfer assembly technique. Self-assembled monolayer (SAM) with a thiol group was used to enhance the transfer of Au films, and the mechanical behaviors were characterized using wrinkle-based test. The test results from micro-tensile and wrinkle-based test are compared to each other, and their implication to the transfer assembly technique is discussed.

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