M-S 기법을 적용한 System Operation의 동작 검증

Verification of System using Master-Slave Structure

  • 김인수 (성균관대학교 정보통신공학부) ;
  • 민형복 (성균관대학교 정보통신공학부) ;
  • 백철기 (성균관대학교 정보통신공학부) ;
  • 박상윤 (대림대학 컴퓨터정보계열)
  • Kim, In-Soo (School of Information and Communication Engineering, Sungkyunkwan University) ;
  • Min, Hyoung-Bok (School of Information and Communication Engineering, Sungkyunkwan University) ;
  • Baek, Chul-Ki (School of Information and Communication Engineering, Sungkyunkwan University) ;
  • Park, Sang-Yun (Division of Computer Science and Information, Daelim College)
  • 발행 : 2008.07.16

초록

Scan design is a structured design-for-testability technique in which flip-flops are re-designed so that the flip-flops are chained in shift registers. We propose a new technique to re-design about clock operation. This technique propose about low power operation of scan clock and saved time of test operation.

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