한국정보디스플레이학회:학술대회논문집
- 2007.08a
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- Pages.224-227
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- 2007
Reconstruction Characteristics of MgO (111) Textured Protective Layer by Over-Frequency Accelerated Discharge in AC Plasma Display Pannel
- Kwon, Sang-Koo (Materials Characterization Group, Device & Materials Laboratory, LG Electronics Institute of Technology) ;
- Kim, Jeong-Ho (Materials Characterization Group, Device & Materials Laboratory, LG Electronics Institute of Technology) ;
- Moon, Seung-Kyu (Materials Characterization Group, Device & Materials Laboratory, LG Electronics Institute of Technology) ;
- Kim, Hyun-Ha (PDP Materials Group, Digital Display Research Laboratory, LG Electronics Inc.) ;
- Park, Kyu-Ho (Materials Characterization Group, Device & Materials Laboratory, LG Electronics Institute of Technology) ;
- Kim, Sung-Tae (PDP Materials Group, Digital Display Research Laboratory, LG Electronics Inc.)
- Published : 2007.08.27
Abstract
The reconstruction characteristics of MgO (111) textured protective layer by over-frequency accelerated discharge in AC-PDP were investigated and correlated to the variations of electronic structures. The reconstruction process and exaggerated grain growth (EGG) were explained by defect-assisted 2-D nucleation and growth mechanism combined with charged cluster model.