Dependence of TMR Ratio on CoFeB Ferromagnetic Electrode Thickness for MgO Barrier Magnetic Tunnel Junctions

  • Ikeda, Shoji (Laboratory for Nanoelectronics and Spintronics, RIEC, Tohoku University) ;
  • Hayakawa, Jun (Laboratory for Nanoelectronics and Spintronics, RIEC, Tohoku University) ;
  • Lee, Young-Min (Laboratory for Nanoelectronics and Spintronics, RIEC, Tohoku University) ;
  • Matsukura, Fumihiro (Laboratory for Nanoelectronics and Spintronics, RIEC, Tohoku University) ;
  • Ohno, Hideo (Laboratory for Nanoelectronics and Spintronics, RIEC, Tohoku University)
  • Published : 2007.05.28