대한전기학회:학술대회논문집 (Proceedings of the KIEE Conference)
- 대한전기학회 2007년도 심포지엄 논문집 정보 및 제어부문
- /
- Pages.149-150
- /
- 2007
3차원 모델링과 반복비교를 통한 TFT-LCD 패널의 결점 검출
Defect Inspection of TFT-LCD Panel using 3D Modeling and Periodic Comparison
- Lee, Kyong-Min (Electrical and Computer Engineering Division, Pohang University of Science and Technology) ;
- Chang, Moon-Soo (Electrical and Computer Engineering Division, Pohang University of Science and Technology) ;
- Park, Poo-Gyeon (Electrical and Computer Engineering Division, Pohang University of Science and Technology)
- 발행 : 2007.10.26
초록
In this paper, we propose a novel defects inspection algorithm for TFT-LCD panels. We first compensate the distorted image caused by the camera distortion and the uneven illumination environment using the least squares method and the bezier surface. We find a starting point of each pattern. The reference frame, made by subtract method using several clean patterns, is compared to each pattern to find defects. The simulation example shows that our algorithm not only inspects the defects well, but also is robust to the 1-pixel error.
키워드