Non-invasive Microwave Metrology Technique for $YBa_{2}Cu_{3}O_{7-{\delta}}$ Film Thickness

• Jung, H.S. (Department of Physics, Konkuk University) ;
• Lee, J.H. (Department of Physics, Konkuk University) ;
• Han, H.K. (Department of Physics, Konkuk University) ;
• Yang, W.I. (Department of Physics, Konkuk University) ;
• Park, E.K. (Department of Physics, Konkuk University) ;
• Lee, Sang-Young (Department of Physics, Konkuk University) ;
• Lee, Byung-Joo (School of Materials Science and Engineering, Seoul National University) ;
• Kim, Chan-Joong (School of Materials Science and Engineering, Seoul National University) ;
• Park, Byung-Woo (School of Materials Science and Engineering, Seoul National University)

• Published : 2007.07.01

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