Proceedings of the KIEE Conference (대한전기학회:학술대회논문집)
- 2007.07a
- /
- Pages.927-928
- /
- 2007
Study on Testing Enclosed low-voltage switchgear and controlgear assemblies Under conditions of arcing due to internal faults
내부고장으로 인한 아크상태의 저압배전반 시험방법 동향 고찰
-
Kim, Sun-Ho
(KERI)
;
-
Kim, Sun-Koo
(KERI)
;
-
Roh, Chang-Il
(KERI)
;
-
Jung, Heung-Soo
(KERI)
;
- Kim, Won-Man (KERI) ;
-
Lee, Dong-Jun
(KERI)
- Published : 2007.07.18
Abstract
Recently IEC has made considerations on testing Enclosed low-voltage switchgear and controlgear assemblies under conditions of arcing due to internal faults. This paper will make a study on testing Enclosed low-voltage switchgear and controlgear assemblies under conditions of arcing due to internal faults that is suggested by IEC.
Keywords