Proceedings of the IEEK Conference (대한전자공학회:학술대회논문집)
- 2006.06a
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- Pages.633-634
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- 2006
Specification-based Analog and Mixed-signal Circuits Test with Minimal Built-In Hardware Overhead
내장 하드웨어 오버헤드를 최소화한 Specification 기반의 아날로그 및 혼합신호 회로 테스트
- Lee, Jae-Min (School of Electronics Information and Communication Engineering Kwandong University)
- 이재민 (관동대학교 전자정보통신공학부)
- Published : 2006.06.21
Abstract
A new specification-based analog and mixed-signal test technique using high performance current sensors is proposed. The proposed technique using current sensors built in external ATE has little hardware overhead in circuit under test and high testability without time consuming operation of test point placement algorithm.
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