Analysis of the extraction efficiency in GaN-light emitting diodes using ray tracing simulation

광경로 시뮬레이션을 이용한 GaN-LED칩의 광추출 효율 분석

  • Lee, Jin-Bock (Central R&D Institute Samsung electro-mechanics CO.,LTD) ;
  • Yoon, Sang-Ho (Central R&D Institute Samsung electro-mechanics CO.,LTD) ;
  • Kim, Dong-Woohn (Central R&D Institute Samsung electro-mechanics CO.,LTD) ;
  • Choi, Chang-Whan (Central R&D Institute Samsung electro-mechanics CO.,LTD)
  • Published : 2006.06.21

Abstract

It was analyzed qualitatively the light extraction in GaN-on-sapphire LEDs based on a simple model. The light extraction efficiency in the LEDs is simulated numerically by using ray tracing method. In the present study, the extraction efficiency was simulated on three different types of LEDs, which a have a different pattered sapphire substrate. And, the role of the patterned sapphire substrate are analyzed and discussed. Based on the analysis, the improvements of extraction efficiency in the LED structures were discussed and these analyses are helpful in the design of high brightness GaN LEDs.

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