대한전자공학회:학술대회논문집 (Proceedings of the IEEK Conference)

대한전자공학회 (The Institute of Electronics and Information Engineers)
권호 표지

OLED의 노화에 따른 밝기 감쇠측정 시스템

Implementation of OLED's Brightness Aging Measurement System

  • 윤현돈 (포항공과대학교 정보통신대학원) ;
  • 정홍 (포항공과대학교 정보통신대학원)
  • Yoon, Hyun-Don (Graduate School for Information Technology Pohang University of Science Technology) ;
  • Hong, Jeong (Graduate School for Information Technology Pohang University of Science Technology)
  • 발행 : 2006.06.21
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초록

This paper presents precise measurement system for the lifetime of OLED. The proposed system collects the data for using voltage drop across the OLED Panels, and then the computer program makes an analysis of the data. In this process of measurement, the current across OLED material must be amplified because the current is very small. However, amplifying the current causes the amplification of noise. Therefore, the proposed system measures the current using an algorithm which minimizes the noise.

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