한국전기전자재료학회:학술대회논문집 (Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference)
- 한국전기전자재료학회 2006년도 추계학술대회 논문집 Vol.19
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- Pages.334-335
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- 2006
내부 보이드 결함에서 발생하는 전기트리의 부분방전 특성
PD Characteristic of Electrical Tree Generated by Inside Void Defect
- Park, Seong-Hee (ChungBuk Univ.) ;
- Jung, Hae-Eun (ChungBuk Univ.) ;
- Kang, Seong-Hwa (ChungCheong Univ.) ;
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Lim, Kee-Jo
(ChungBuk Univ.)
- 발행 : 2006.11.09
초록
Solid insulation exposed to voltage is degraded by electrical tree process. And the degradation of the insulation is accelerated by voltage application. For this experimental, specimen of electrical tree model is made by XLPE (cross-linked polyethylene). And the size of the specimen is 7*5*7