한국전기전자재료학회:학술대회논문집 (Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference)
- 한국전기전자재료학회 2006년도 추계학술대회 논문집 Vol.19
- /
- Pages.330-331
- /
- 2006
실리콘박막의 증착시간에 따른 감마계수 측정법 개발
Measurement of Secondary Electron Emission Coefficient on Deposition Time of the Silicon Thin Films
- Lee, Jung-Hui (Division of Electronics and Information, Chonbuk National University) ;
- Choi, Byoung-Jung (Division of Electronics and Information, Chonbuk National University) ;
- Yang, Sung-Chae (Division of Electronics and Information, Chonbuk National University)
- 발행 : 2006.11.09
초록
Recently, plasma display panels (PDPs) are highlighted for the flat type display device. Therefore, much attention has been paid to secondary electron emission coefficient of the electrode protective material of PDPs. As PDPs is developing, the concern about secondary electron emission coefficient (