Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference (한국전기전자재료학회:학술대회논문집)
- 2006.11a
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- Pages.112-113
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- 2006
Holographic grating data erasure of amorphous Ag/As-Ge-Se-S multi-layer thin film
비정질 Ag/As-Ge-Se-S 다층박막에 형성된 홀로그램 격자의 소거에 관한 연구
- Kim, Jin-Hong (Dept of Electronic Materials Eng. Kwangwoon Univ.) ;
- Koo, Yong-Woon (Dept of Electronic Materials Eng. Kwangwoon Univ.) ;
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Koo, Sang-Mo
(Dept of Electronic Materials Eng. Kwangwoon Univ.)
;
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Chung, Hong-Bay
(Dept of Electronic Materials Eng. Kwangwoon Univ.)
- Published : 2010.04.01
Abstract
In this paper. we investigated a characteristic of holographic grating data erasure with non-polarized beam at amorphous chalcogenide As-Ge-Se-S thin film. A sample of holographic grating data was formed with DPSS laser for setup. Then, the erasure process was performed with He-Ne laser vertically at sample. As-Ge-Se-S(single layer). Ag/As-Ge-Se-S(double layer) and As-Ge-Se-S/Ag/As-Ge-Se-S(multi-layer) are manufactured to compare their characteristic of erasure.