Proceedings of the Korean Society of Precision Engineering Conference (한국정밀공학회:학술대회논문집)
- 2006.10a
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- Pages.63-64
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- 2006
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- 2005-8446(pISSN)
Analysis on Phenomenon that can be used as Measures in Detecting Total Backlash
전체 백래시 검출수단으로 사용될 수 있는 현상에 대한 분석
- Baek, J.H. (NEX1 Future Co., Ltd., R&D Center, Mechanical Group) ;
- Kim, Jie-Eok (NEX1 Future Co., Ltd., R&D Center, Mechanical Group) ;
- Kim, Jin-Cheon (NEX1 Future Co., Ltd., R&D Center, Mechanical Group)
- Published : 2006.10.18