LCD모듈의 얼룩검사에 관한 연구

A Study on the Spot Inspection for LCD Modules

  • 이재혁 (한국외국어대학교 전자정보공학부)
  • 발행 : 2006.10.27

초록

This paper suggests an automatic spot-inspection algorithm for LCD modules. Usually, LCD module testing is classified by two categories. One is for uniform pattern testing and the other is Non-uniform testing. The uniform pattern testing is well defined and also fully automated in the factory. However non-uniform pattern testing is not defined well yet, so non-uniform testing is conducted by human operators. In this paper a spot-pattern, which is one of non-uniform pattern, inspection algorithms are proposed. The performance of the proposed algorithm is tested by extensive simulations using artificial slot-patterns and real ones in the LCD modules.

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