The New Generation Laser Dicing Technology for Ultra Thin Si wafer

  • Kumagai, Masayoshi (Hamamatsu Photonics K.K.) ;
  • Uchiyama, N. (Hamamatsu Photonics K.K.) ;
  • Atsumi, K. (Hamamatsu Photonics K.K.) ;
  • Fukumitsu, K. (Hamamatsu Photonics K.K.) ;
  • Ohmura, E. (Osaka Univ.) ;
  • Morita, H. (Hamamatsu Photonics K.K.)
  • Published : 2006.10.11

Abstract

Process & mechanism $\blacklozenge$ The process consists from two steps which are laser processing step and separation steop. $\blacklozenge$ The wavelength of laser beam is transmissible wavelength for the wafer. However, inside of Si wafer is processed due to temperature dependence of optical absorption coefficient Advantage & Application $\blacklozenge$ Advantages are high speed dicing, no debris contaminants, completely dry process, etc. $\blacklozenge$ The cutting edges were fine, The lifetime and endurances did not degrade the device characteristics $\blacklozenge$ A separation of a wafer with DAF was introduced as an application for SiP

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