Proceedings of the Korean Reliability Society Conference (한국신뢰성학회:학술대회논문집)
- 2006.05a
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- Pages.181-191
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- 2006
Failure-Time Estimation from Nonlinear Random-Coefficients Model: PDP Degradation Analysis
PDP 열화분석 예제를 통한 랜덤계수모델에서의 고장시간분포 추정
- Bae, Suk-Joo (Department of Industrial Engineering, Hanyang University) ;
- Kim, Seong-Joon (Department of Industrial Engineering, Hanyang University)
- Published : 2006.05.18
Abstract
As an alternative to traditional life testing, degradation tests can be effective in assessing product reliability when measurements of degradation leading to failure can be observed. This article proposes a new model to describe the nonlinear degradation paths caused by nano-contamination for plasma display panels (PDPs) : a bi-exponential model with random coefficients. A sequential likelihood ratio test was executed to select random effects in the nonlinear model. Analysis results indicate that the reliability estimation can be improved substantially by using the nonlinear random-coefficients model to incorporate both inherent degradation characteristics and contamination effects of impurities for PDP degradation paths.
Keywords