Failure-Time Estimation from Nonlinear Random-Coefficients Model: PDP Degradation Analysis

PDP 열화분석 예제를 통한 랜덤계수모델에서의 고장시간분포 추정

  • Bae, Suk-Joo (Department of Industrial Engineering, Hanyang University) ;
  • Kim, Seong-Joon (Department of Industrial Engineering, Hanyang University)
  • Published : 2006.05.18

Abstract

As an alternative to traditional life testing, degradation tests can be effective in assessing product reliability when measurements of degradation leading to failure can be observed. This article proposes a new model to describe the nonlinear degradation paths caused by nano-contamination for plasma display panels (PDPs) : a bi-exponential model with random coefficients. A sequential likelihood ratio test was executed to select random effects in the nonlinear model. Analysis results indicate that the reliability estimation can be improved substantially by using the nonlinear random-coefficients model to incorporate both inherent degradation characteristics and contamination effects of impurities for PDP degradation paths.

Keywords