Investigation on Temperature Dependent Switching Current In NiO Films For the Application of ReRAM

  • Jung, Kyoo-Ho (Thin Film Material Research Center, Korea Institute of Science and Technology) ;
  • Seo, Hong-Woo (Department of Semiconductor Science, Dongguk University) ;
  • Park, Jea-Wan (Thin Film Material Research Center, Korea Institute of Science and Technology) ;
  • Yang, Min-Kyu (Thin Film Material Research Center, Korea Institute of Science and Technology) ;
  • Kim, Dal-Young (Thin Film Material Research Center, Korea Institute of Science and Technology) ;
  • Lee, Jeon-Kook (Thin Film Material Research Center, Korea Institute of Science and Technology) ;
  • Im, Hyun-Sik (Department of Semiconductor Science, Dongguk University)
  • Published : 2005.08.18