Composition Depth Profiling of Fe/Ni and Pt/Co Multilayers Using a Buckminsterfullerene ($C_{60}$) Ion

  • Kim, K.J. (Nano Surface Group, Korea Research Institute of Standards and Science) ;
  • Moon, D.W. (Nano Surface Group, Korea Research Institute of Standards and Science) ;
  • Chi, P. (Surface and Microanalysis Science Division, National Institute of Standards and Technology) ;
  • Simons, D. (Surface and Microanalysis Science Division, National Institute of Standards and Technology) ;
  • Gillen, G. (Surface and Microanalysis Science Division, National Institute of Standards and Technology)
  • 발행 : 2005.08.18