Non-invasive Measurements of the Thickness of Thin Superconductor Films and Metallic Films by Using the Dielectric Resonator Method

Han, Hyun-Kyung (department of Advanced Technology Fusion and Center for Emerging Wireless Transmission Technology, Konkuk University) ;
Lee, J.H. (Department of Physics and Center for Emerging Wireless Transmission Technology, Konkuk University) ;
Park, E.K. (Department of Physics and Center for Emerging Wireless Transmission Technology, Konkuk University) ;
Jung, H.S. (Department of Physics and Center for Emerging Wireless Transmission Technology, Konkuk University) ;
Lee, C.S. ;
Lee, Sang-Young (department of Advanced Technology Fusion and Center for Emerging Wireless Transmission Technology, Konkuk University, Department of Physics and Center for Emerging Wireless Transmission Technology, Konkuk University) ;
Lee, Byung-Joo (School of Materials Science and Engineering, Seoul National University) ;
Park, Byung-Woo (School of Materials Science and Engineering, Seoul National University)