Multi-physics analysis for the design and development of micro-thermoelectric coolers

  • Han, Seung-Woo (Micro System and Structural Mechanics Group, Korea Institute of Machinery & Materials) ;
  • Hasan, MD Anwarul (Micro System and Structural Mechanics Group, Korea Institute of Machinery & Materials) ;
  • Kim, Jung-Yup (Micro System and Structural Mechanics Group, Korea Institute of Machinery & Materials) ;
  • Lee, Hyun-Woo (Department of Mechanical Engineering, Pusan National University) ;
  • Lee, Kong-Hoon (HVAC and Cryogenic Engineering Group, Korea Institute of Machinery & Materials) ;
  • Kim, Oo-Joong (HVAC and Cryogenic Engineering Group, Korea Institute of Machinery & Materials)
  • Published : 2005.06.02

Abstract

A rigorous research is underway in our team, for the design and development of high figure of merits (ZT= 1.5${\sim}$2.0) micro-thermoelectric coolers. This paper discusses the fabrication process that we are using for developing the $Sb_2Te_3-Bi_2Te_3$ micro-thermoelectric cooling modules. It describes how to obtain the mechanical properties of the thin film TEC elements and reports the results of an equation-based multiphysics modeling of the micro-TEC modules. In this study the thermoelectric thin films were deposited on Si substrates using co-sputtering method. The physical mechanical properties of the prepared films were measured by nanoindentation testing method while the thermal and electrical properties required for modeling were obtained from existing literature. A finite element model was developed using an equation-based multiphysics modeling by the commercial finite element code FEMLAB. The model was solved for different operating conditions. The temperature and the stress distributions in the P and N elements of the TEC as well as in the metal connector were obtained. The temperature distributions of the system obtained from simulation results showed good agreement with the analytical results existing in literature. In addition, it was found that the maximum stress in the system occurs at the bonding part of the TEC i.e. between the metal connectors and TE elements of the module.

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