한국원자력학회:학술대회논문집 (Proceedings of the Korean Nuclear Society Conference)
- 한국원자력학회 2005년도 춘계학술발표회
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- Pages.709-710
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- 2005
Evaluation for RTD Circuits Diagnosis System Under the Severe Accident Conditions
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Koo, Kil-Mo
(Korea Atomic Energy Research Institute) ;
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Kim, Sang-Baik
(Korea Atomic Energy Research Institute) ;
- Kim, Hee-Dong (Korea Atomic Energy Research Institute) ;
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Joung, Young-Moo
(Korea Atomic Energy Research Institute) ;
- Park, Chi-Seong (KAITEC)
- 발행 : 2005.05.26