Proceedings of the Korean Nuclear Society Conference (한국원자력학회:학술대회논문집)

Korean Nuclear Society (한국원자력학회)
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X-Ray Diffraction Measurements of Ion-Irradiated Graphite

  • Kim, Dae-Jong (Department of Nuclear and Quantum Engineering, Korea Advanced Institute of Science and Technology) ;
  • Jang, Chang-Heui (Department of Nuclear and Quantum Engineering, Korea Advanced Institute of Science and Technology) ;
  • Kim, In-Sup (Department of Nuclear and Quantum Engineering, Korea Advanced Institute of Science and Technology) ;
  • Kim, Eung-Seon (Korea Atomic Energy Resuarch Institute) ;
  • Chi, Se-Hwan (Korea Atomic Energy Resuarch Institute)
  • Published : 2005.05.26
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Abstract

There are some differences as a result of comparison between internal and external standard method. Thin-film XRD was used to measure the thin damaged layer by proton irradiation. Experiment was performed by external standard method to measure bulk sample accurately. A little changes of crystallite size and lattice parameter by small dose were observed. X-ray penetrates too deeply above damaged layer of graphite despite of small X-ray incident angle.

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