Digital Processor Module Reliability Analysis of Nuclear Power Plant

  • Lee, Sang-Yong (SAMCHANG ENTERPRISE CO., LTD. Control Technology Research Institute / R&D group Reliability Research Team) ;
  • Jung, Jae-Hyun (SAMCHANG ENTERPRISE CO., LTD. Control Technology Research Institute / R&D group Reliability Research Team) ;
  • Kim, Jae-Ho (SAMCHANG ENTERPRISE CO., LTD. Control Technology Research Institute / R&D group Reliability Research Team) ;
  • Kim, Sung-Hun (SAMCHANG ENTERPRISE CO., LTD. Control Technology Research Institute / R&D group Reliability Research Team)
  • 발행 : 2005.10.27