Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference (한국전기전자재료학회:학술대회논문집)
- 2005.07a
- /
- Pages.236-237
- /
- 2005
Formation and Dispersion Measurement in Semiconducting Materials Using the SEM and AFM
SEM과 AFM을 사용한 반도전 재료 내 카본블랙의 형태 및 분산성 측정
- Lee, Kyoung-Yong (Wonkwang University) ;
- Yang, Jong-Seok (Wonkwang University) ;
- Nam, Jong-Chul (DaeYang Material Co. LTD) ;
- Choi, Yong-Sung (Wonkwang University) ;
- Park, Dong-Ha (DaeYang Material Co. LTD.) ;
- Park, Dae-Hee (Wonkwang University)
- Published : 2005.07.07
Abstract
To measure surface roughness and smoothness of semiconducting materials in power cable, we have investigated the formation and growth process of carbon black showed by changing the content of carbon black. The specimens were primarily kneaded in material samples of pellet form for 5 minutes on rollers ranging between 70[