Effect of substrate temperature on the properties of aluminum doped zinc oxide by DC magnetron sputtering

  • Koo, Hong-Mo (Division of Materials Science and Engineering, Hanyang University) ;
  • Kim, Se-Hyun (Division of Materials Science and Engineering, Hanyang University) ;
  • Moon, Yeon-Keon (Division of Materials Science and Engineering, Hanyang University) ;
  • Park, Jong-Wang (Division of Materials Science and Engineering, Hanyang University) ;
  • Jeong, Chang-Ho (LCD R&D Center, Samsung Electronics Co., Ltd.)
  • Published : 2005.07.19

Abstract

Transparent conducting aluminum-doped zinc oxide (AZO) thin films have been deposited on corning 1737 glass by DC magnetron sputter. The structural, electrical and optical properties of the films were investigated as a function of various substrate temperatures. AZO thin films were fabricated by dc magnetron sputtering with AZO ceramic target $(Al_2O_3: 2wt %)$. The obtained films were poly crystalline with a hexagonal wurtzite structure and preferentially oriented in the (002) crystallographic direction. The lowest resistivity is $6.0{\times}10^{-4}$ Ocm with the carrier concentration of $2.694{\times}10^{20}\;cm^{-3}$ and Hall mobility of $20.426cm^2/Vs$. The average transmittance in the visible range was above 90%.

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