Effects of Various Post-Treatments of Carbon Nanotube Films for Reliable Field Emission

  • Han, Jae-Hee (Department of Materials Engineering, Sungkyunkwan University) ;
  • Lee, Su-Hong (Department of Materials Engineering, Sungkyunkwan University) ;
  • Berdinsky, Alexander S. (Department of Materials Engineering, Sungkyunkwan University) ;
  • Yoo, Ji-Beom (Department of Materials Engineering, Sungkyunkwan University) ;
  • Park, Chong-Yun (Department of Materials Engineering, Sungkyunkwan University) ;
  • Choi, Jin-Ju (School of Electronics Engineering, Gwangwoon University) ;
  • Jung, Tae-Won (Materials and Devices Lab., Samsung Advanced Institute of Technology) ;
  • Han, In-Taek (Materials and Devices Lab., Samsung Advanced Institute of Technology) ;
  • Kim, Jong-Min (Materials and Devices Lab., Samsung Advanced Institute of Technology)
  • Published : 2005.07.19

Abstract

In this report, the FE characteristics of carbon nanotubes (CNTs) treated using both thermal annealing and mechanical coatings on the as-grown CNTs system atically studied. It was found that in the high temperature annealed samples, CNTs were attacked at its root during annealing due to a small amount of oxygen, and were pulled out of the substrate in places after FE measurements because of the contact resistance. However, for the mechanically coated samples both with spin on glass (SOG) and polymethyl methacrylate (PMMA), CNTs were found to be nearly intact after FE measurements and showed reliable FE characteristics over repeatable voltage scan. The reliability of CNTs during FE could be owing to the strong adhesion of CNTs to the substrate both by SOG and PMMA coatings.

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