Proceedings of the Korean Society of Precision Engineering Conference (한국정밀공학회:학술대회논문집)
- 2005.06a
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- Pages.1079-1082
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- 2005
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- 2005-8446(pISSN)
2M Class CCM(Compact Camera Module) Defect Inspection
2M급 CCM(Compact Camera Module) 불량 검사
- Cho S.Y. (Control & Measurement Eng. Sunmoon Univ.) ;
-
Ko K.W.
(Control & Measurement Eng. Sunmoon Univ.)
;
- Lee Y.J. (Control & Measurement Eng. Sunmoon Univ.) ;
- Lee J.H. (Control & Measurement Eng. Sunmoon Univ.) ;
- Kang C.G. (Control & Measurement Eng. Sunmoon Univ.)
- 조수용 (선문대학교 제어계측학과) ;
-
고국원
(선문대학교 제어 계측학과)
;
- 이유진 (선문대학교 제어 계측학과) ;
- 이중현 (선문대학교 제어계측학과) ;
- 강충구 (선문대학교 제어계측학과)
- Published : 2005.06.01
Abstract
This paper deals with the algorithm development that inspects defects such as Lens Focus, Focus check, Black Defect, Dark Defect, Dim Defect, Color Defect, and Line Defect, Angle Defect, IrisAgc Defect caused by the process of 2M Class Compact Camera Module (CCM). Domestic market was majorly comprised of VGA(0.3 million pixel) market. But in the middle of year 2004, camera phone with Mega Pixel has appeared, and it is estimated that the camera phone with Mega Pixel will take up to 28% of total phone sales if it is released in the end of year 2004. Since the inspection of finished products is done manually, it is major obstacle in production increment In this paper, to solve these problems, we developed the imaging processing algorithm to inspect the defects in captured image of assembled CCM. The performances of the developed inspection system and we can recognize various types of defect of CCM modules with good accuracy and high speed