Proceedings of the Korean Institute of IIIuminating and Electrical Installation Engineers Conference (한국조명전기설비학회:학술대회논문집)
- 2005.11a
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- Pages.161-165
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- 2005
The Analysis of life distribution for Light Source using degradation Tests of Luminous Flux
광속의 열화시험을 이용한 광원의 수명분포 분석
- Lee, S.H. (Korea Institute of Lighting Technology) ;
- Shin, S.W. (Korea Institute of Lighting Technology) ;
- Cho, M.R. (Korea Institute of Lighting Technology) ;
- Hwang, M.K. (Korea Institute of Lighting Technology) ;
- Yang, S.Y. (Korea Institute of Lighting Technology)
- Published : 2005.11.04
Abstract
In this paper, we observed degradation characteristics of luminous flux for new light source. Because degradation tests can be a useful tool for assessing the reliability when few or even no failures are expected in a life tests. And we use a simple random coefficient degradation model to induce most suitable equation of degradation. As a result, exponential distribution and equation is best suitable model for new light source.
Keywords