Measurement of local strain and atomic distribution in InGaAs/GaAsP Multi-quantum well

  • Baik, Sung-Il (School of Materials Science and Engineering, Seoul National University) ;
  • Kim, Ki-Sung (Photonics Laboratory, Samsung Advanced Institute of Technology) ;
  • Park, Young-Jo (Photonics Laboratory, Samsung Advanced Institute of Technology) ;
  • Kim, Young-Woon (School of Materials Science and Engineering, Seoul National University)
  • 발행 : 2005.05.01