Wafer-Level MEMS Packaging : Fundamentals, Reliability Issues and Applications

  • Ham S. J. (Packaging Center, Samsung Advanced Institute of Technology) ;
  • Jeong B. G. (Packaging Center, Samsung Advanced Institute of Technology) ;
  • Lim J. H. (Packaging Center, Samsung Advanced Institute of Technology) ;
  • Choi M. S. (Packaging Center, Samsung Advanced Institute of Technology) ;
  • Lee S. W. (Packaging Center, Samsung Advanced Institute of Technology) ;
  • Jung K. D. (Packaging Center, Samsung Advanced Institute of Technology) ;
  • Hwang J. S. (Packaging Center, Samsung Advanced Institute of Technology) ;
  • Lee M. C. (Packaging Center, Samsung Advanced Institute of Technology) ;
  • Kwon J. O. (Packaging Center, Samsung Advanced Institute of Technology) ;
  • Wang Q. (Packaging Center, Samsung Advanced Institute of Technology) ;
  • Kim W. B. (Packaging Center, Samsung Advanced Institute of Technology) ;
  • Moon C. Y. (Packaging Center, Samsung Advanced Institute of Technology)
  • Published : 2005.09.01