Proceedings of the KIEE Conference (대한전기학회:학술대회논문집)
- 2005.07c
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- Pages.1887-1889
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- 2005
Strain-Stress and Fractural Structure Measurement of EVA, EEA and EBA/Carbon Black Composites
EVA, EEA, EBA와 카본블랙 복합재료의 인장강도 및 파단구조 측정
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Yang, J.S.
(Wonkwang University) ;
- Lee, K.Y. (Wonkwang University) ;
- Choi, Y.S. (Wonkwang University) ;
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Park, D.H.
(Wonkwang University)
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양종석
(원광대학교 전기전자 및 정보공학부) ;
- 이경용 (원광대학교 전기전자 및 정보공학부) ;
- 최용성 (원광대학교 전기전자 및 정보공학부) ;
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박대희
(원광대학교 전기전자 및 정보공학부)
- Published : 2005.07.18
Abstract
To measure the mechanical and structural properties of semiconducting materials in power cable, we have investigated the stress-strain and fractural structure of semiconducting materials showed by changing the content of carbon black. Those were made as sheets after pressing for 20 minutes at
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