Stepwise test case generation for embedded s/w

임베디드 소프트웨어 테스트 케이스 단계적 생성

Automatic test case generation for testing an embedded software is considered. Existing tools for test case generation such as finite state machine or mutant test usually adopt top down approach and depend upon graphical transition and decision table, which makes it difficult to find out where the bugs exist. Also it is hard to describe the special features of embedded systems such as concurrent execution of individual components. Most of embedded systems interacts with the real world, receiving signals through sensors or switches and sending output signals to actuators that somehow manipulate the environment. Embedded software controls the entire system based on the logics such as interpreting the sensor inputs and making the actuators to start or stop their intended operation. This study proposes an automatic test case generation procedure that tests the system starting from the control logics of sensors, switches and actuators and then their concurrent execution controls, and finally the entire system operation. Such a stepwise approach makes it easy to generate test cases to tell where the bugs of embedded software exist.