Investigation of band alignment of $HfO_2$ and $Al_{2}O_{3}$ thin films using XPS

• Jin, Hua (Department of Physics, Chungbuk National University) ;
• Lee, S.W. (Department of Physics, Chungbuk National University) ;
• Kang, H.J. (Department of Physics, Chungbuk National University) ;
• Lee, Y.S. (Division of Information Communication and Computer Engineering, Hanbat National University) ;
• Cho, M.H. (Nano Surface Group, Korea Research Institute of Standard and Science)

• Published : 2004.08.19

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