Proceedings of the Korean Vacuum Society Conference (한국진공학회:학술대회논문집)
- 2004.08a
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- Pages.187-187
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- 2004
Determination of the precise surface direction in the nanometer scale using a stable Si(6 9 17) facet existing on Si(5 5 12): Nanoscale Metrology
- Zhu, Y.Z. (Department of Physics, Chonbuk National University) ;
- Seo, Jae-M. (Department of Physics, Chonbuk National University)
- Published : 2004.08.19
Abstract
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