Period -Doubling Perturbation Induced by Defects on In/Si(111) -4$\times$1 Surface

  • Lee, Geun-Seop (Department of Physics, Inha University) ;
  • Yu, Sang-Yong (Division of Material Evaluation and Chemical Metrology, Korea Research Institute of Standard and Science) ;
  • Kim, Han-Chul (Division of Material Evaluation and Chemical Metrology, Korea Research Institute of Standard and Science) ;
  • Koo, Ja-Yong (Division of Material Evaluation and Chemical Metrology, Korea Research Institute of Standard and Science)
  • Published : 2004.08.19