Fault Current Limiting Characteristics of Flux-lock Type $High-T_c$ Superconducting Fault Current Limiter

  • Park, Hyoung-Min (Electrical Engineering, Chosun University) ;
  • Choi, Hyo-Sang (Electrical Engineering, Chosun University) ;
  • Lim, Sung-Hun (Research Center of Industrial Technology Engineering Research Institute, Chonbuk National University) ;
  • Park, Chung-Ryul (Electronics and Information Engineering, Chonbuk National University) ;
  • Han, Byoung-Sung (Electronics and Information Engineering, Chonbuk National University) ;
  • Hyun, Ok-Bae (Korea Electric Power Research Institute)
  • Published : 2004.08.16