한국원자력학회:학술대회논문집 (Proceedings of the Korean Nuclear Society Conference)
- 한국원자력학회 2004년도 추계학술발표회 발표논문집
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- Pages.1115-1116
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- 2004
NAA and low-background ${\gamma}-spectrometry$ for the analysis of U and Th in high purity silica used in electronic devices
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Lee, Kil-Yong
(Groundwater and Geothermal Division, Korea Institute of Geoscience and Mineral Resources) ;
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Yoon, Yoon-Yeol
(Groundwater and Geothermal Division, Korea Institute of Geoscience and Mineral Resources) ;
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Cho, Soo-Young
(Groundwater and Geothermal Division, Korea Institute of Geoscience and Mineral Resources) ;
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Seo, Bum-Kyoung
(Korea Atomic Energy Research Institute) ;
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Chung, Yong-Sam
(Korea Atomic Energy Research Institute)
- 발행 : 2004.10.28