NAA and low-background ${\gamma}-spectrometry$ for the analysis of U and Th in high purity silica used in electronic devices

• Lee, Kil-Yong (Groundwater and Geothermal Division, Korea Institute of Geoscience and Mineral Resources) ;
• Yoon, Yoon-Yeol (Groundwater and Geothermal Division, Korea Institute of Geoscience and Mineral Resources) ;
• Cho, Soo-Young (Groundwater and Geothermal Division, Korea Institute of Geoscience and Mineral Resources) ;
• Seo, Bum-Kyoung (Korea Atomic Energy Research Institute) ;
• Chung, Yong-Sam (Korea Atomic Energy Research Institute)

• Published : 2004.10.28

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