A Comparison between Fault Tree Analysis and Reliability Graph with General Gates

  • Kim, Man-Cheol (Dept. of Nuclear and Quantum Eng., Korea Advanced Institute of Science and Technology) ;
  • Jung, Woo-Sik (Korea Atomic Energy Research Institute) ;
  • Seong, Poong-Hyun (Dept. of Nuclear and Quantum Eng., Korea Advanced Institute of Science and Technology)
  • 발행 : 2004.10.28