In Situ Analysis of Domain Structures in Epitaxial $Pb(Zr,Ti)O_3$ Thin Films and Discrete Islands Using Synchrotron X-Ray Diffraction

  • Lee Kilho (Dept. of Materials Science and Engineering, POSTECH) ;
  • Kim Yong Kwan (Dept. of Materials Science and Engineering, POSTECH) ;
  • Baik Sunggi (Dept. of Materials Science and Engineering, POSTECH)
  • Published : 2004.10.01