Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference (한국전기전자재료학회:학술대회논문집)
- 2004.11a
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- Pages.356-362
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- 2004
V-t Characteristics and Survival Probability of Turn-to-Turn Models for HTS Transformer
고온초전도 변압기를 위한 턴간 모델의 V-t 특성 및 생존 확률
- Baek, Seung-Myeong (Gyeongsang National University and Engineering Research Institute) ;
- Cheon, Hyeon-Gweon (Gyeongsang National University and Engineering Research Institute) ;
- Nguyen, Van-Dung (Gyeongsang National University and Engineering Research Institute) ;
- Seok, Bok-Yeol (Hyundai Heavy Industries Co., Ltd.) ;
- Kim, Sang-Hyun (Gyeongsang National University and Engineering Research Institute)
- Published : 2004.11.11
Abstract
Using multi wrapped copper by polyimide film for HTS transformer, the breakdown and V-t characteristics of two type models for turn-to-turn, one is point contact model, the other is surface contact model, were investigated under ac and impulse voltage at 77 K. A material that is Polyimide film (Kapton) 0.025 mm thickness is used for multi wrapping of the electrode. Statistical analysis of the results using Weibull distribution to examine the wrapping number effects on V-t characteristics under at voltage as well as breakdown voltage under ac and impulse voltage in