Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference (한국전기전자재료학회:학술대회논문집)
- 2004.07a
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- Pages.489-494
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- 2004
A Study on Thermal Properties and Impurities Measurement of Semiconductive Shield by ICP-AES
ICP-AES에 의한 반도전재료의 불순물 측정 및 열적특성에 관한 연구
- Lee, Kyoung-Yong (Wonkwang University) ;
- Choi, Yong-Sung (Wonkwang University) ;
- Park, Dae-Hee (Wonkwang University)
- Published : 2004.07.05
Abstract
In this paper, we investigated impurities content and thermal properties showing by changing the content of carbon black which is semiconductive materials for underground power transmission. Specimens were made of sheet form with the three of existing resins and the nine of specimens for measurement. Impurities content of specimens was measured by ICP-AES(Inductively Coupled Plasma Atomic Emission Spectrometer), and density of specimens were measured by density meter. And then heat capacity(